MEASURE AND TAG THE CARRIER-ENVELOPE PHASE OF YOUR LASER SYSTEM ON THE FLY
Understanding the carrier-envelope phase (CEP) offset is crucial in strong-field laser-matter interactions. Our CEP-tag system revolutionizes this application with its ability to deliver fast, single-shot measurements of the CEP offset in ultrafast laser pulses.
Using the proven technique of f-2f interferometry, our system broadens the input pulse spectrum over an octave and interferes the blue edge with the second harmonic of the red edge to retrieve the CEP offset.
Our cutting-edge solutions feature a digital or an all-optical analog fast Fourier transform to extract the CEP offset. To expand the repetition rate limitations of the digital version, the analog version incorporates FPGA electronics to boost the single shot measurement capabilities up to 1 MHz.
Embrace the precision of next-generation laser pulse analysis with the CEP-tag system
Key features
• Single-shot CEP measurement and tagging.
• Digital models – acquisition at up to 400 kHz.
• Analog models * – acquisition at up to few MHz.
| CEP-tag D | |
| Central wavelength | 800 nm, 1030 nm |
| Repetition Rate | 170, 200, 300 or 400 kHz |
| Input Polarisation | Linear |
| Input aperture diameter | 10 mm |
| Input energy | >100 nJ |
| Dimensions (WxLxH) | 200 x 200 x 55 mm |
(*) To be released
Talk to us for different wavelengths and model options
