The d-scan is an inline, compact and high-performance device for the simultaneous measurement and compression of even the most demanding ultrashort laser pulses
Sphere Ultrafast Photonics is committed to finding the best solution for measuring your laser system, providing custom solutions covering different wavelength ranges, pulse durations and repetition rates
Benefiting from more than 15 years of experience, Sphere Ultrafast Photonics offers a new generation of products and services in the ultrafast pulsed laser regime
The CEP-tag system provides measurement of the Carrier Envelope Phase (CEP) offset of amplified laser pulses at single-shot. It is based upon traditional f-2f interferometry, where the second harmonic of the red edge of an octave-spanning spectrum is spectrally interfered with the blue edge. Detection is based on a photodiode array and the use of Field-Programmable Gate Array (FPGA) electronics enables us to determine the CEP at a rate of 100 kHz.
Online single-shot CEP measurement and tagging.
Acquisition at up to 100kHz.
Integration with d-scan system for compact footprint