MEASURE AND TAG THE CARRIER-ENVELOPE PHASE OF YOUR LASER SYSTEM ON THE FLY
Understanding the carrier-envelope phase (CEP) offset is crucial in strong-field laser-matter interactions. Our CEP-tag system revolutionizes this application with its ability to deliver fast, single-shot measurements of the CEP offset in amplified laser pulses.
Leveraging the proven technique of f-2f interferometry, our system combines the second harmonic of the pulse’s red edge with the blue edge of an octave-spanning spectrum for accessing the CEP.
Our cutting-edge solution features a photodiode array for accurate detection, and with the integration of Field-Programmable Gate Array (FPGA) electronics, it boasts the capability to measure CEP at an impressive rate of 130 kHz.
Embrace the precision of next-generation laser pulse analysis with the CEP-tag system
The CEP-tag’s intuitive graphical user interface offers users rapid access to all essential measurement and control parameters for streamlined operation.
Key features
• Online single-shot CEP measurement and tagging.
• Acquisition at up to 130 kHz.
• Integration with d-scan system for compact footprint
| CEP-tag | |
| Central wavelength | 800 nm, 1030 nm |
| Repetition Rate | up to 130 kHz |
| Input Polarisation | Linear |
| Input aperture diameter | 7 mm |
| Input energy | >10 μJ |
| Dimensions (WxLxH) | 250 x 240 x 100 mm |
